Technique Title
Evaluation of heat-shielding glass (compliant with JIS R 3106/3107 and ISO 9050)
Measurement of Diamond-Like Carbon (DLC) by Raman spectroscopy
Simplified method for the evaluation phthalates
Evaluation of semiconductor materials by Raman spectroscopy – Crystal polymorphism and carrier density of Silicon power semiconductor device –
Discernment of the vermillion ink by Raman spectroscopy
Determination of ortho and para hydrogen ratio by using Raman spectroscopy
Observation and Measurement examples using Dark-field and MIX observation
Analysis of the orientation and secondary structure of spider silk using polarized microscopic Raman spectroscopy
Evaluation of polymer crystallinity by broadband measurement and IR imaging
Solution for Highly Stable Molecular Weight Distribution Measurement – Dual Flow GPC Dedicated System
Evaluation of Gel Nails (Photo-curing Resins)
Semiconductor and Material Research Applications (4)
Film Thickness, Fluorescence, Raman
Semiconductor and Material Research Applications (3)
Fluorescence, FTIR Microscopy, Raman
Semiconductor and Material Research Applications (2)
Fluorescence, FTIR Microscopy, Raman