Technique Title
Elimination of environmental factors in vacuum FTIR – silicon wafer –
Foreign material measurement supported by “Measurement Assist” function and “Sample Search” function
Validity of DLATGS detector for infrared microscope
Evaluation of Anti-Reflection Films using Absolute Reflectance Measurement
Evaluation of Privacy Films using Automated Absolute Reflectance Measurement
Advanced solution by using “Clear-View” ATR objective
Mapping measurement using IQ Mapping function of IRT-5000/7000
Rapid measurement of sample in container using macro measurement unit
Evaluation of pigments in works of art by Raman Spectroscopy
Evaluation of crystallization on plastic (polyethylene terephthalate) bottle
Evaluation of Single-Walled Carbon Nanotube (SWNT) by Raman Spectroscopy
Imaging measurement of facial cleanser by using Clear-View ATR
IR microscope with heating stage for evaluating the melting / phase transition
Foreign material analysis by using ATR PRO 4X VIEW
Foreign matter analysis using TGS detector for micro region measurement
Studies of transition metal complexes by using Near Infrared CD Spectrometer
Measurement of complex forming reaction of Nickel Sulfate and Rochelle salt
Circularly Polarized Luminescence