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Technique Title

FTIR Microscopy

IR microscope with heating stage for evaluating the melting / phase transition

Foreign material analysis by using ATR PRO 4X VIEW

FTIR Microscopy

Foreign matter analysis using TGS detector for micro region measurement

Circular Dichroism

Studies of transition metal complexes by using Near Infrared CD Spectrometer

Circular Dichroism

Measurement of complex forming reaction of Nickel Sulfate and Rochelle salt

Circularly Polarized Luminescence

Sensitivity, accuracy and resolution of CPL-300

Quantum yield measurement of the up-conversion phosphors with heavy rare earth

FTIR Microscopy

Analysis of Mixed Foreign Materials by Infrared Microscope

Evaluation of heat-shielding glass (compliant with JIS R 3106/3107 and ISO 9050)

Measurement of Diamond-Like Carbon (DLC) by Raman spectroscopy

Simplified method for the evaluation phthalates

Evaluation of semiconductor materials by Raman spectroscopy – Crystal polymorphism and carrier density of Silicon power semiconductor device –

Discernment of the vermillion ink by Raman spectroscopy

Determination of ortho and para hydrogen ratio by using Raman spectroscopy

Observation and Measurement examples using Dark-field and MIX observation

Analysis of the orientation and secondary structure of spider silk using polarized microscopic Raman spectroscopy

FTIR, FTIR Microscopy

Evaluation of polymer crystallinity by broadband measurement and IR imaging

Solution for Highly Stable Molecular Weight Distribution Measurement – Dual Flow GPC Dedicated System

Evaluation of Gel Nails (Photo-curing Resins)

Semiconductor and Material Research Applications (4)