Technique Title
Studies of transition metal complexes by using Near Infrared CD Spectrometer
Measurement of complex forming reaction of Nickel Sulfate and Rochelle salt
Circularly Polarized Luminescence
Sensitivity, accuracy and resolution of CPL-300
Quantum yield measurement of the up-conversion phosphors with heavy rare earth
Analysis of Mixed Foreign Materials by Infrared Microscope
Evaluation of heat-shielding glass (compliant with JIS R 3106/3107 and ISO 9050)
Measurement of Diamond-Like Carbon (DLC) by Raman spectroscopy
Simplified method for the evaluation phthalates
Evaluation of semiconductor materials by Raman spectroscopy – Crystal polymorphism and carrier density of Silicon power semiconductor device –
Discernment of the vermillion ink by Raman spectroscopy
Determination of ortho and para hydrogen ratio by using Raman spectroscopy
Observation and Measurement examples using Dark-field and MIX observation
Analysis of the orientation and secondary structure of spider silk using polarized microscopic Raman spectroscopy
Evaluation of polymer crystallinity by broadband measurement and IR imaging
Solution for Highly Stable Molecular Weight Distribution Measurement – Dual Flow GPC Dedicated System
Evaluation of Gel Nails (Photo-curing Resins)
Semiconductor and Material Research Applications (4)
Film Thickness, Fluorescence, Raman
Semiconductor and Material Research Applications (3)
Fluorescence, FTIR Microscopy, Raman