Technique Title
Foreign matter analysis using TGS detector for micro region measurement
Analysis of 2-dimensional FTIR mapping of the regional metamorphic rock
NIR Imaging of tablet surface by using IR Microscope
Analysis of Mixed Foreign Materials by Infrared Microscope
Evaluation of polymer crystallinity by broadband measurement and IR imaging
Fluorescence, FTIR Microscopy, Raman
Semiconductor and Material Research Applications (2)
Fluorescence, FTIR Microscopy, Raman