Optimized Observation Optics
Equipped with a 5MP high-resolution camera and newly designed optics, the system produces vivid, high-contrast observation images. Clear observation images can be achieved even under low-light conditions, such as when analyzing low-reflectivity samples or using visible polarizers.
Iris root (transmission)
Contamination on solder (reflection)
Printing on a business card (reflection)
Observation image (x16 cassegrain mirror)
Electric Iris Mechanism
An electronically controlled iris mechanism operates in synchronization with both observation and measurement modes, providing sharper observation images while also enhancing spectral data quality.
Without electric iris
With electric iris
Observation image of electronic board (x16 cassegrain mirror)
Polarization Observation Function
When equipped with the optional visible polarization observation function, the system enables visualization of sample birefringence, offering valuable insights into molecular orientation and crystallinity. This capability is particularly effective for observing materials with orientation-dependent properties, including plastics, polymers, and fibers.
Conventional observation
Polarization observation
Polarization observation of uniaxially stretched film
Multiple images
The use of multiple images enables the acquisition of clear, wide-field images.
Infrared imaging measurement of rice with husks – microscopic reflection method –
left: observation image (stereomicroscope), center: observation image (4x objective lens), right: overlay of observation image and chemical image (green: protein, orange: lipid, blue: starch)
We would like to express our sincere gratitude to JASCO Engineering Co., Ltd., Japan, for providing the data.
Spiral Imaging
Images can be acquired in a spiral pattern from the current field of view position, enabling the system to effectively scan the entire sample for quick exploration of the measurement targets.
Examples of spiral imaging
Simultaneous Monitoring of Measurement and Observation
The direct-through method enables visualization of regions that are otherwise obscured by the aperture, allowing the entire sample area beyond the measurement region to be observed. In addition, IQ Monitor allows users to simultaneously view microscopic images and spectral data during measurement point selection, ensuring more precise and informed analysis.
IQ Monitor